Title :
IEE Half-Day Colloquium on Uncertainties Made Easy (Ref. No.1996/168)
Abstract :
The following topics were discussed: uncertainty evaluation in measurements; large EMC uncertainties; uncertainty assessment in a commercial production environment; uncertainty documents
Keywords :
measurement errors; EMC uncertainties; measurements; production environment; uncertainty documents; uncertainty evaluation;
Conference_Titel :
Uncertainties Made Easy (Digest No. 1996/168), IEE Colloquium on
Conference_Location :
London
