Title :
Testability issues in analog cellular neural networks
Author :
Huertas, José ; Rueda, Adoración
Author_Institution :
Centro Nacional de Microelectronica, Sevilla Univ., Spain
Abstract :
Addresses the problem of testing an ACNN by postulating the need of including some extra hardware to rend feasible a post-fabrication test. The work presented deals with a test methodology based on adding some extra circuitry to every cell of a regular ACNN. This methodology is just an initial proposal for taking an advantage of the network regularity to perform a global test that can be externally interpreted and, hence, has potential application for reconfiguring the network
Keywords :
VLSI; cellular arrays; integrated circuit testing; neural nets; IC testing; VLSI; analog cellular neural networks; network regularity; post-fabrication test; testability; Cellular neural networks; Circuit faults; Circuit testing; Computer networks; Fabrication; Hardware; Intelligent networks; Large-scale systems; Performance evaluation; Proposals;
Conference_Titel :
Cellular Neural Networks and their Applications, 1990. CNNA-90 Proceedings., 1990 IEEE International Workshop on
Conference_Location :
Budapest
DOI :
10.1109/CNNA.1990.207522
