DocumentCode
3109830
Title
Design of experiments for low voltage electrical machine insulation lifetime modeling
Author
Maussion, P. ; Faucher, J.
Author_Institution
LAPLACE (Lab. Plasma et Conversion d´´Energie), Univ. de Toulouse, Toulouse, France
fYear
2010
fDate
4-7 July 2010
Firstpage
1259
Lastpage
1264
Abstract
The design of experiments will help to underline the influence of combined operating constraints in insulation reliability of low voltage electrical machines in aerospace applications in the more electric aircraft. Kapton films and coated wires were subjected to an accelerated ageing under combined stresses (VRMS, frequency, DC voltage, and temperature). It is shown in this paper, that the parameters can be classified with respect to their influence order. Frequency shift from 1 to 10 kHz is more hazardous than a RMS voltage shift from 0.7 to 1.2 kV or a temperature shift from 150 to 200°C. Thanks to experimental design, different mathematical models of sample life time, relying on statistical analysis, have been established. Moreover, some guidelines that help to derive the wire model form from the film model are proposed.
Keywords
ageing; design of experiments; electric machines; insulation testing; machine insulation; reliability; statistical analysis; Kapton films; RMS voltage shift; accelerated ageing; coated wires; design of experiments; electric aircraft; frequency 1 kHz to 10 kHz; frequency shift; insulation reliability; insulation testing; low voltage electrical machine insulation lifetime modeling; mathematical models; statistical analysis; temperature 150 degC to 200 degC; temperature shift; voltage 0.7 kV to 1.2 kV; Aging; Design methodology; Films; Insulation; Mathematical model; Temperature; Wires; Design of Experiments; Dielectric breakdown; Dielectric films; Insulation testing; Life time estimation; Modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics (ISIE), 2010 IEEE International Symposium on
Conference_Location
Bari
Print_ISBN
978-1-4244-6390-9
Type
conf
DOI
10.1109/ISIE.2010.5637019
Filename
5637019
Link To Document