• DocumentCode
    3109830
  • Title

    Design of experiments for low voltage electrical machine insulation lifetime modeling

  • Author

    Maussion, P. ; Faucher, J.

  • Author_Institution
    LAPLACE (Lab. Plasma et Conversion d´´Energie), Univ. de Toulouse, Toulouse, France
  • fYear
    2010
  • fDate
    4-7 July 2010
  • Firstpage
    1259
  • Lastpage
    1264
  • Abstract
    The design of experiments will help to underline the influence of combined operating constraints in insulation reliability of low voltage electrical machines in aerospace applications in the more electric aircraft. Kapton films and coated wires were subjected to an accelerated ageing under combined stresses (VRMS, frequency, DC voltage, and temperature). It is shown in this paper, that the parameters can be classified with respect to their influence order. Frequency shift from 1 to 10 kHz is more hazardous than a RMS voltage shift from 0.7 to 1.2 kV or a temperature shift from 150 to 200°C. Thanks to experimental design, different mathematical models of sample life time, relying on statistical analysis, have been established. Moreover, some guidelines that help to derive the wire model form from the film model are proposed.
  • Keywords
    ageing; design of experiments; electric machines; insulation testing; machine insulation; reliability; statistical analysis; Kapton films; RMS voltage shift; accelerated ageing; coated wires; design of experiments; electric aircraft; frequency 1 kHz to 10 kHz; frequency shift; insulation reliability; insulation testing; low voltage electrical machine insulation lifetime modeling; mathematical models; statistical analysis; temperature 150 degC to 200 degC; temperature shift; voltage 0.7 kV to 1.2 kV; Aging; Design methodology; Films; Insulation; Mathematical model; Temperature; Wires; Design of Experiments; Dielectric breakdown; Dielectric films; Insulation testing; Life time estimation; Modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2010 IEEE International Symposium on
  • Conference_Location
    Bari
  • Print_ISBN
    978-1-4244-6390-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2010.5637019
  • Filename
    5637019