Title :
Extraction and simulation of realistic CMOS faults using inductive fault analysis
Author :
Ferguson, F. Joel ; Shen, John P.
Author_Institution :
Comput. Eng., California Univ., Santa Cruz, CA, USA
Abstract :
FXT is a software tool which implements inductive fault analysis for CMOS circuits. It extracts a comprehensive list of circuit-level faults for any given CMOS circuit and ranks them according to their relative likelihood of occurrence. Five commercial CMOS circuits are analyzed using FXT. Of the extracted faults, approximately 50% can be modeled by single-line stuck-at 0/1 fault model. Faults extracted from two circuits are simulated with the switch-level fault simulator FMOSSIM. The test set provided by the circuits´ manufacturer, which detects 100% of the single-line stuck-at 0/1 faults, detected between 73% and 89% of the simulated faults
Keywords :
CMOS integrated circuits; automatic testing; electronic engineering computing; fault location; integrated circuit testing; software tools; CMOS faults; FXT; inductive fault analysis; simulation; software tool; stuck at faults; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Semiconductor device modeling; Software tools; Switching circuits; Virtual manufacturing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207759