Dynamic techniques for yield enhancement of field programmable logic arrays

Two techniques are presented to increase the effective yield of field programmable logic arrays (FPLAs). In the first technique, a reconfiguration scheme is proposed to dynamically alter the product-term allocation of the mask PLA onto the product lines of the raw FPLA once a type-two fault is diagnosed. This technique does not require any extra product lines to obtain a usable destination FPLA. The second technique utilizes the often unused product lines within the FPLA. It is shown that once an error is detected during the programming procedure, a product line can always be desensitized from the rest of the FPLA. The intended product term is then simply reprogrammed onto one of the extra product lines