Title :
Fault isolation in grey systems
Author :
Su, Stephen Y H ; Ma, Hede
Author_Institution :
State Univ. of New York, Binghamton, NY, USA
Abstract :
The concepts of grey, white, and black systems are formally introduced and developed into logic testing area, i.e. the area of error detection and fault isolation, to find a direction to establish more efficient test schemes for testing digital systems at a reasonable cost. A probabilistic isolation strategy realized by a heuristic and decision-making algorithm is presented to isolate faults in grey systems efficiently in terms of computation space and time
Keywords :
automatic test equipment; error detection; fault location; integrated logic circuits; logic testing; probability; ATE; computation space; computation time; decision-making algorithm; error detection; fault isolation; grey systems; heuristic algorithm; logic testing; probabilistic isolation strategy; Circuit faults; Circuit testing; Costs; Decision making; Digital systems; Fault detection; Integrated circuit interconnections; Integrated circuit testing; Logic testing; System testing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207780
