Title :
Analysis of experimental results on functional testing and diagnosis of complex circuits
Author :
Bellon, C. ; Velazco, R. ; Ziade, H.
Author_Institution :
Lab. de Genie Inf., Grenoble, France
Abstract :
A number of functional-level test approaches for microprocessors have been proposed. The GAPT approach, presented here, is a pragmatic one, but it is supported by a set of tools and experimental results. The authors describe the GAPT approach in detail. They draw tentative conclusions with respect to the effectiveness and scope of these functional test generation methods
Keywords :
VLSI; automatic testing; integrated circuit testing; microprocessor chips; IC testing; VLSI; automatic testing; diagnosis of complex circuits; functional testing; microprocessor chips; microprocessors; Circuit faults; Circuit testing; Error correction; Failure analysis; Microprocessors; Programmable circuits; Software testing; Software tools; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207781
