Title :
Software environment for 500-MHz VLSI test system ULTIMATE
Author :
Adachi, T. ; Tanno, M. ; Sudo, T.
Author_Institution :
LSI Lab., NTT, Kanagawa, Japan
Abstract :
The software environment of ULTIMATE has been described. Distributed processing by three-layer processors and parallelism of per-pin controllers make it possible to attain high-speed and flexible data processing. Since ULTIMATE is connected to a host computer as a terminal device, users can operate it in the same environment as CAD-application programs. Operationability is thus greatly improved compared with conventional stand-alone testers. This arrangement also results in a powerful fault analysis tool in cooperation with an electron beam tester
Keywords :
VLSI; automatic test equipment; automatic testing; integrated circuit testing; programming environments; 500 MHz; ATE; IC testing; ULTIMATE; VLSI test system; fault analysis tool; flexible data processing; parallelism; software environment; three-layer processors; Automatic control; Circuit testing; Control systems; Hardware; Large scale integration; Logic design; Logic testing; Software testing; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207788
