• DocumentCode
    3110523
  • Title

    Integration of nanophotonic devices for on-chip optical interconnects

  • Author

    Assefa, Solomon ; Xia, Fengnian ; Bedell, S.W. ; Zhang, Ying ; Topuria, Teya ; Rice, Philip M. ; Vlasov, Yurii A.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2009
  • fDate
    13-17 July 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Compact germanium waveguide photodetector with 40 Gbps bandwidth and 0.4 A/W responsivity is demonstrated. High-quality Ge-on-insulator single-crystalline layer was monolithically integrated into front-end CMOS process by lateral seeded crystallization.
  • Keywords
    CMOS integrated circuits; germanium; integrated optics; nanophotonics; optical interconnections; optical waveguides; photodetectors; Ge; bit rate 40 Gbit/s; front end CMOS process; germanium-on-insulator single-crystalline layer; lateral seeded crystallization; nanophotonic device integration; on chip optical interconnects; waveguide photodetector; Bandwidth; CMOS process; Crystallization; Germanium; Nanoscale devices; Optical interconnections; Optical materials; Optical waveguides; Photodetectors; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-4102-0
  • Electronic_ISBN
    978-1-4244-4103-7
  • Type

    conf

  • DOI
    10.1109/OECC.2009.5214256
  • Filename
    5214256