Title :
Boundary scan with cellular-based built-in self-test
Author :
Gloster, Clay S., Jr. ; Brglez, Franc
Author_Institution :
North Carolina A&T State Univ., Greensboro, NC, USA
Abstract :
Boundary scan merging with built-in self-test is discussed. The proposed implementation of boundary scan represents a snapshot of the Joint Test Advisory Group Recommendation 1.0, while the built-in self-test implements the features of cellular automata. Test patterns generated from two distinct sources are examined, one with registers using cellular automata and the other, based on the conventional LFSR (linear-feedback shift register) configuration. Distinctive effects of these patterns on fault coverage of specific designs are analyzed and illustrated
Keywords :
automatic testing; fault location; finite automata; logic testing; printed circuit testing; shift registers; PC testing; boundary scan; cellular automata; cellular-based built-in self-test; fault coverage; linear-feedback shift register; logic testing; test patterns; Automatic testing; Built-in self-test; Circuit testing; Connectors; Costs; Packaging; Pattern analysis; Pins; Registers; Test pattern generators;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207791
