Title :
Value of testability standards in testing commercial products
Author :
Richards, David J.
Author_Institution :
Digital Equipment Corp., Andover, MA, USA
Abstract :
The author reviews the salient features of the proposed JTAG boundary-scan architecture design-for testability standard. The focus is on the standards utility in testing commercial products
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; measurement standards; production testing; JTAG boundary-scan architecture; commercial products; design-for testability standard; testability standards; Circuit testing; Complexity theory; Counting circuits; Design for testability; Integrated circuit interconnections; Logic design; Logic devices; Logic testing; Proposals; Standards organizations;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207801
