• DocumentCode
    3110754
  • Title

    Practice and theory [IC testing]

  • Author

    McCluskey, E.J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
  • fYear
    1988
  • fDate
    12-14 Sep 1988
  • Firstpage
    203
  • Lastpage
    204
  • Abstract
    The author addresses the question of knowledge transfer between industry and academy in the area of integrated-circuit (IC) testing. He first examines the movement of theory from academia to industrial practice, finding two problems: designers are evaluated on meeting deadlines not on testability; and most designers do not know how to ensure testability in a systematic fashion. The solutions are technological-implementation of either design rules and design-rule checkers to guarantee testability or the use of testability measure programs-and educational, i.e. teaching design for testability as an integral part of logic design. The author then discusses the problems of teaching the relevance of theory to current industrial practice at the University ball. He finds more problems and lists the causes of the irrelevance of theory, including industry-university consulting policies, funding mechanisms that depend on peer review, and the frequent difficulty of determining the relevance of novel theory before its industrial applications
  • Keywords
    education; integrated circuit testing; logic design; logic testing; teaching; IC testing; academy; consulting policies; design for testability; design-rule checkers; electronic engineering; industrial applications; industrial practice; knowledge transfer; logic design; teaching; theory; Costs; Education; Integrated circuit testing; Joining processes; Life testing; Logic design; Logic testing; Reliability engineering; Reliability theory; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1988. Proceedings. New Frontiers in Testing, International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-0870-6
  • Type

    conf

  • DOI
    10.1109/TEST.1988.207802
  • Filename
    207802