DocumentCode :
3110850
Title :
The KARL/KARATE system-automatic test pattern generation based on RT level descriptions
Author :
Alfs, Gerold ; Hartenstein, Reiner W. ; Wodtko, Andrea
Author_Institution :
Dept. of Comput. Sci., Kaiserslautern Univ., West Germany
fYear :
1988
fDate :
12-14 Sep 1988
Firstpage :
230
Lastpage :
235
Abstract :
A system is described for automatic test-pattern generation (ATPG) using symbolic representations and heuristics to attack the test problem at RT level, where redesigns to increase the testability are relatively cheap. In contrast to other ATPG tools based on RT-level hardware descriptions, KARATE includes tests for primitive operators and allows the modification and redefinition of fault models. KARATE has been implemented in Pascal on a VAX 11/750. The search algorithm, provisional libraries, and test program generators have been actually implemented and the heuristics included are tested. The final version of the library handler and a special pattern editor, which allows the comfortable specification of patterns, are under development
Keywords :
automatic testing; logic testing; software packages; KARL/KARATE system; Pascal; RT level; VAX 11/750; automatic test-pattern generation; heuristics; library handler; logic testing; pattern editor; search algorithm; symbolic representations; testability; Automatic test pattern generation; Circuit faults; Computer science; Graphics; Hardware; Software systems; Switches; Test pattern generators; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-8186-0870-6
Type :
conf
DOI :
10.1109/TEST.1988.207807
Filename :
207807
Link To Document :
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