Title :
AFM study of atomic-flat terraces on ZnWO4 (010) cleaved surface
Author :
Kozhukhov, Anton S. ; Atuchin, Victor V. ; Galashov, Evgeny N. ; Shlegel, Vladimir N.
Author_Institution :
Phys. Dept., Novosibirsk State Univ., Novosibirsk, Russia
fDate :
June 30 2011-July 4 2011
Abstract :
Atomic force microscopy (AFM) is a useful instrument to explore the top-surface properties. The nano-morphology of ZnWO4 (010) cleaved surface has been evaluated in the present study. Optical-quality ZnWO4 crystal has been grown by the Low Thermal Gradient Czochralski technique. An atomically smooth surface can be obtained by mechanical cleaving under ambient atmospheric conditions due to high cleavage of ZnWO4 crystal parallel the (010). Atomic steps with height of 0.57 nm were observed by AFM measurements. The steps contain mesodefect peaks with height of ~1 nm located uniformly on the cleaved surface.
Keywords :
atomic force microscopy; crystal growth from melt; crystal morphology; zinc compounds; AFM; ZnWO4; ZnWO4 (010) cleaved surface; atomic force microscopy; atomic-flat terraces; low thermal gradient Czochralski method; mechanical cleaving; nanomorphology; optical-quality crystal; top-surface properties; Annealing; Atomic measurements; Chemistry; Crystals; Physics; Surface morphology; Surface topography; AFM; ZnWO4; cleavage; wolframite;
Conference_Titel :
Micro/Nanotechnologies and Electron Devices (EDM), 2011 International Conference and Seminar of Young Specialists on
Conference_Location :
Erlagol, Altai
Print_ISBN :
978-1-61284-793-1
DOI :
10.1109/EDM.2011.6006883
