Title :
Application of a commercial data base management system to memory device test program generation and debugging
Author_Institution :
Megatest Corp., San Jose, CA, USA
Abstract :
The use of a commercial database management system in test programming interface is described, enumerating the features that simplify test-program development. An application of a commercial database is described in which flow control and most device parameters are specified in the form of database tables, with a natural interactive interface. The report generation capabilities of the database are used to generate source code from database records, and an extension to the development interface permits it to be used to view and modify parameters during program execution
Keywords :
automatic programming; automatic testing; database management systems; digital storage; program debugging; report generators; automatic testing; commercial data base management system; memory device; natural interactive interface; report generation; test program debugging; test program generation; Debugging; Hardware; Memory management; Productivity; System testing; Timing; Voltage control; Writing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207813
