IC qualityd and test transparency

Author

McCluskey, E.J. ; Buelow, Fred

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA

fYear

1988

fDate

12-14 Sep 1988

Firstpage

295

Lastpage

301

Abstract

The authors examine the question of whether fault grading is necessary and if yes, how high the single-stuck fault coverage must be? They show that, not only is fault grading required, but that extremely high single stuck fault coverage is probable necessary. The results presented are extensions of previous work in this area by T.W. Williams (1985). The authors discuss only functional or Boolean testing, which does not involve measurement, but determines whether logic functions are correct. The question of how thorough a Boolean test procedure need be is the main focus. The need for extremely thorough testing is demonstrated

Keywords

Boolean functions; fault location; integrated circuit testing; integrated logic circuits; logic testing; production testing; quality control; Boolean testing; IC quality; fault grading; functional testing; logic functions; logic testing; single-stuck fault coverage; test transparency; Automatic testing; Circuit faults; Circuit testing; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit testing; Integrated circuit yield; Manufacturing processes; Materials testing; Production;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-8186-0870-6

Type

conf

DOI

10.1109/TEST.1988.207814

Filename

207814