(Chem)DeTEX automatic generation of a markup language description of (chemical) documents from bitmap images

This paper presents a novel view of document processing, as being the reverse process to T_EX. This concept simplifies the analysis of the physical structure of documents, and also suggests the use of a style file for layout recognition. An algorithm is given for both phases, layout analysis and layout recognition. The bottom-up layout analysis method employed is based on the Kruskal´s algorithm and uses the distances between the components to construct the physical page structure. The algorithm is linear with respect to the number of the connected components. For layout recognition, a document style description language (DSDL) is introduced. This helps a fault-tolerant, recursive parsing algorithm to label the blocks of the document. The presented methods were designed to be used for scientific publications (papers, reports, books), but could be applied to a broader range of documents