Title :
Some new techniques in waveshape capture and analysis
Author :
Downey, Arthur E. ; Matsuda, Kazuhiko
Author_Institution :
Ando Corp., Sunnyvale, CA, USA
Abstract :
The techniques implemented in WAVESCAN have resulted in a waveshape capture and analysis tool that is fast and easy to use, and which at the same time provides the user with a more accurate and comprehensive view of real-time signal behavior at the pins of a VLSI device under test. A lack of published specifications and benchmark data on other waveshape software makes rigorous comparison impossible; however, it is believed the techniques described in this work represent a significant advancement
Keywords :
VLSI; automatic test equipment; automatic testing; computer aided analysis; distributed processing; integrated circuit testing; software packages; waveform analysis; ATE; VLSI; WAVESCAN; analysis; software packages; waveshape capture; waveshape software; Automatic testing; Circuit testing; Displays; Electronic equipment testing; Graphics; Integrated circuit testing; Pins; Time measurement; Velocity measurement; Voltage;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207834
