• DocumentCode
    3111473
  • Title

    Fault bundling: reducing machine evaluation activity in hierarchical concurrent fault simulation

  • Author

    Nicholls, William H. ; Soma, Mani

  • Author_Institution
    Boeing Electron. High Technol. Center, Seattle, WA, USA
  • fYear
    1988
  • fDate
    12-14 Sep 1988
  • Firstpage
    569
  • Lastpage
    573
  • Abstract
    A method of bundling error data is proposed which should significantly reduce the amount of explicit functional evaluation required for hierarchical concurrent simulation. The bundling operation is carried out at run time, and so is different from but complementary to approaches such as WRAP, which compress unnecessary or uninteresting portions of circuit hierarchy. The technique is exact; it does not cause the simulation to become probabilistic. This work extends the concept of multilist traversal (MLT). A hierarchy is imposed on the conventional machine list which matches the design hierarchy of the circuit under simulation. The resulting improvement in machine-list organization is expected to prevent multiple evaluations of behavioral primitives for collections of faults which present the same input value
  • Keywords
    automatic testing; digital simulation; electronic engineering computing; error analysis; fault location; multiprocessing systems; error data; fault bundling; hierarchical concurrent fault simulation; machine-list organization; multilist traversal; Acceleration; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Performance evaluation; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1988. Proceedings. New Frontiers in Testing, International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-0870-6
  • Type

    conf

  • DOI
    10.1109/TEST.1988.207838
  • Filename
    207838