• DocumentCode
    3111592
  • Title

    Development of a Distributed Process Mining System for Reactive Ion Etching Enhancement

  • Author

    Tsang, KF ; Lau, Henry CW ; Kwok, SK

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Hong Kong Polytech. Univ., Hong Kong
  • fYear
    2006
  • fDate
    16-18 Aug. 2006
  • Firstpage
    282
  • Lastpage
    287
  • Abstract
    A Distributed Process Mining System (DPMS) is discussed in this paper which aims to optimize the process in order to offer shorter production time, easier quality defect identification and higher customer satisfaction. This proposed system is equipped with the idea of "distributed process mining" discovering the hidden relationships between each working decision in distributed manner. This method incorporates the On-line Analytical Processing (OLAP) and the decision tree-based Artificial Neural Networks (ANNs) algorithms into decision making for ensuring "doing the right things" within the process and relevant workflow. A case study of using Reactive Ion Etching (RIE) in a magnetic head manufacturer is included.
  • Keywords
    customer satisfaction; data mining; distributed processing; magnetic heads; neural nets; optimisation; production engineering computing; quality control; sputter etching; artificial neural networks; customer satisfaction; distributed process mining system; magnetic head manufacturer; online analytical processing; quality defect identification; reactive ion etching enhancement; Algorithm design and analysis; Artificial neural networks; Customer satisfaction; Decision making; Decision trees; Etching; Magnetic analysis; Magnetic heads; Manufacturing; Production systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Informatics, 2006 IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    0-7803-9700-2
  • Electronic_ISBN
    0-7803-9701-0
  • Type

    conf

  • DOI
    10.1109/INDIN.2006.275794
  • Filename
    4053401