• DocumentCode
    3111606
  • Title

    Performance of a Silicon-on-Insulator MEMS gyroscope with digital force feedback

  • Author

    Kranz, Michael ; Burgett, S. ; Hudson, Teresa ; Buncick, Milan ; Ruffin, Paul ; Ashley, P. ; McKee, Jim

  • Author_Institution
    Morgan Res. Corp., Huntsville, AL, USA
  • fYear
    2004
  • fDate
    26-29 April 2004
  • Firstpage
    7
  • Lastpage
    14
  • Abstract
    This paper presents development efforts and laboratory test data for a Silicon-on-Insulator (SOI) Micro Electro Mechanical System (MEMS) vibratory angular rate sensor intended for wide dynamic range and harsh environment applications, such as those experienced by hypervelocity and small diameter missiles and munitions. The SOI angular rate sensor (gyroscope), utilizes advantages offered from the mass and feature sizes achieved by Deep Reactive Ion Etching (DRIE). This particular effort focused on developing a symmetric device design, along with multi-bit sigma-delta force-feedback control, to increase dynamic range and reduce susceptibility to environmental parameters, including temperature, vibration, and sustained Z-axis acceleration loading. The rate sensing performance of these devices in both open-loop and closed-loop configurations has been characterized in the laboratory and a unit has been flight-tested on a prototype hypervelocity missile.
  • Keywords
    gyroscopes; micromechanical devices; microsensors; silicon-on-insulator; sputter etching; Deep Reactive Ion Etching; SOI; Silicon-on-Insulator MEMS gyroscope; closed-loop configurations; digital force feedback; harsh environment applications; hypervelocity; multi-bit sigma-delta force-feedback control; open-loop configurations; rate sensing performance; small diameter missiles; small diameter munitions; symmetric device design; vibratory angular rate sensor; wide dynamic range; Dynamic range; Force feedback; Gyroscopes; Mechanical sensors; Mechanical systems; Micromechanical devices; Missiles; Sensor systems and applications; Silicon on insulator technology; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Position Location and Navigation Symposium, 2004. PLANS 2004
  • Print_ISBN
    0-7803-8416-4
  • Type

    conf

  • DOI
    10.1109/PLANS.2004.1308967
  • Filename
    1308967