Title :
An expert test program generation system for per-pin testers
Author :
Walter, A. ; Kleinman, Y. ; Edelshteyn, L. ; Gartner, J.
Author_Institution :
IBM, Hopewell Junction, NY, USA
Abstract :
The development is discussed of a rules-based automatic test-program generator (ATPG) that integrates IBM´s CAD (computer-aided design) system with a per-pin tester. The authors describe the versatility of the ATPG that gleans test patterns and the logic model from the CAD system, merges produce technology characteristics and generates a complete test program that verifies the electrical, functional, and timing integrity of the device under test
Keywords :
automatic programming; automatic testing; circuit CAD; expert systems; logic testing; CAD; IBM; automatic test-program generator; expert test program generation; logic model; per-pin testers; Automatic test pattern generation; Automatic testing; Character generation; Design automation; Logic design; Logic devices; Logic testing; System testing; Test pattern generators; Timing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207850
