Title :
On the testing of multiplexers
Author :
Makar, Samy R. ; McCluskey, Edward J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
Abstract :
Minimal test sets for different implementations of multiplexer are derived. The length of the minimal test set of any multiplexer is shown to be at least twice the number of data inputs. A set of pseudoexhaustive patterns is derived for different implementation. In all the implementations investigated, the length of the test was only 1.5 times the minimal length. The detectability profile of the different multiplexer implementations are derived. These profiles are used to determine the expected fault coverage of pseudorandom test patterns as a function of the test length. This fault coverage compared with coverage from actual simulations
Keywords :
digital integrated circuits; electronic equipment testing; fault location; logic testing; multiplexing equipment; detectability profile; fault coverage; pseudoexhaustive patterns; pseudorandom test patterns; test length; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Digital circuits; Electrical fault detection; Fault detection; Linear feedback shift registers; Multiplexing; Packaging;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207851
