Title :
Test head design using electrooptic receivers and GaAs pin electronics for a gigahertz production test system
Author :
Henley, Francois J. ; Choi, Hee-June
Author_Institution :
Photon Dynamics Inc., San Jose, CA, USA
Abstract :
A test head subsystem providing ultrahigh-speed digital signal paths to a device under test is introduced and described. The test head houses liquid-cooled GaAs pin electronics capable of NRZ (non-return-to-zero) data rates up to 1.2 Gb/s. A novel test system receiver scheme utilizing an electrooptic (laser) measurement method is described which captures pin information by connecting the device under test (DUT) to a laser scanned optical sensor assembly having multiple test points. The receiver has a 4.5-GHz bandwidth and can perform ECL (emitter-coupled logic) level functional test with one sampling pulse per vector. Using transmission line theory and advanced interconnection technology, a device environment was design which supports signal bandwidth approaching 5 GHz to connect the GaAs drivers, electrooptic receivers, and the DUT
Keywords :
III-V semiconductors; electronic equipment testing; emitter-coupled logic; gallium arsenide; logic testing; measurement by laser beam; production testing; test equipment; 1.2 Gbit/s; 4.5 GHz; 5 GHz; ECL; GaAs; device under test; drivers; electrooptic measurement; electrooptic receivers; functional test; interconnection technology; laser beam application; laser scanned optical sensor; non return to zero data rates; pin electronics; test head design; transmission line theory; Bandwidth; Electronic equipment testing; Electrooptic devices; Gallium arsenide; Lasers and electrooptics; Logic testing; Optical receivers; Optical signal processing; System testing; Transmission line measurements;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207855
