High-speed pattern generator and GaAs pin electronics for a gigahertz production test system

Author

Kratzer, Dean J. ; Barton, Steve ; Benley, F.J. ; Plomgrem, David A.

Author_Institution

Photon Dynamics Inc., San Jose, CA, USA

fYear

1988

fDate

12-14 Sep 1988

Firstpage

710

Lastpage

718

Abstract

A high-speed pattern generator system having a 1.2-GHz NRZ (non-return-to-zero) data rate capability is introduced. The phase-locked loop per pin architecture has independent timing and adjust and utilizes a Nd:YAG laser system as a precise timing reference. The per pin architecture has a delay range of +/- 1 data cycle with 10-ps placement resolution. This delay range is implemented with a combination of analog and digital techniques yielding a data edge jitter of <10 ps RMS. Also presented are algorithms for pattern length to enhance throughput for a sampling measurement system

Keywords

III-V semiconductors; digital integrated circuits; gallium arsenide; integrated circuit testing; logic testing; measurement by laser beam; phase-locked loops; production testing; 1.2 GHz; 10 ps; GaAs; YAG:Nd; YAl5O12:Nd; high-speed pattern generator; non-return-to-zero data rate; pattern length; per pin architecture; phase-locked loop; pin electronics; production test system; production testing; sampling measurement system; timing reference; Circuit testing; Delay; Electronic equipment testing; Gallium arsenide; Laser cavity resonators; Phase locked loops; Production systems; System testing; Test pattern generators; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-8186-0870-6

Type

conf

DOI

10.1109/TEST.1988.207856

Filename

207856