DocumentCode
3111908
Title
Orthogonal Robust Design Method for Product Quality
Author
Li, Yongxian ; Chen, Weizeng ; Ding, Jinfu ; Wu, Shouyi
Author_Institution
Transp. Coll., Zhejiang Normal Univ., Jinhua, China
fYear
2009
fDate
8-9 Dec. 2009
Firstpage
120
Lastpage
123
Abstract
The robust parameter design is effective method that is to produce high quality product at low cost to the manufacturer. This paper analyses disadvantages of Taguchi quality method, of which the amount of calculation is increased, algorithm is complicated, and the optimal value of variables in parameter design is updated in regression analysis. Having discovered a lot of useful information not to be utilized in Taguchi quality method, this paper introduces a new robust design method based on orthogonal optimization and variance ratio analysis. The optimal values of parameter and tolerance, at one time, can be obtained by means of successive-orthogonal arrays and variance ratio analysis in parameter design. The best solution in last orthogonal arrays and its tolerance selected by variance ratio analysis make up of factors in successive-orthogonal arrays. The bigger is variance ratio in last orthogonal arrays, the smaller is forecast range of tolerance in successive-orthogonal arrays. It is not necessary to make tolerance design after parameter design and to use crossed array design, signal-to-noise ratio analysis and regression analysis. Numerical result shows that the new method is far simpler and more convenient than Taguchi quality method.
Keywords
Taguchi methods; optimisation; product development; regression analysis; Taguchi quality method; orthogonal optimization; orthogonal robust design method; product quality; regression analysis; signal-to-noise ratio analysis; tolerance design; variance ratio analysis; Algorithm design and analysis; Analysis of variance; Costs; Design methodology; Design optimization; Information analysis; Manufacturing; Regression analysis; Robustness; Signal design; Taguchi quality method; orthogonal optimization; product quality; robust parameter design; variance ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Innovation Management, 2009. ICIM '09. International Conference on
Conference_Location
Wuhan
Print_ISBN
978-0-7695-3911-9
Type
conf
DOI
10.1109/ICIM.2009.34
Filename
5381272
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