DocumentCode
3111957
Title
Flexible deep memory architecture aids program development
Author
Russo, John L.
Author_Institution
Teradyne Inc., Boston, MA, USA
fYear
1988
fDate
12-14 Sep 1988
Firstpage
752
Lastpage
754
Abstract
The author describes a solution to the cost and programmability problems of analog VLSI tester pattern memory design that combines high-speed random-access memory with lower-cost deep dynamic memory to provide deep pattern storage without program restrictions at a reasonable cost. One of the benefits of the deep memory design is that the high-speed ECL (emitter-coupled logic) pattern address microcontroller need only manipulate a 16000-location address space, yet it has control over memory several million locations deep. The design of the interleaved memory address controller is simplified because the memory has no looping or conditional jumping requirements
Keywords
VLSI; automatic programming; automatic test equipment; economics; emitter-coupled logic; linear integrated circuits; memory architecture; random-access storage; analog VLSI tester pattern memory design; cost; deep dynamic memory; deep memory architecture; deep pattern storage; high-speed ECL; high-speed random-access memory; interleaved memory address controller; pattern address microcontroller; program development; programmability; Acquired immune deficiency syndrome; Analog computers; Automatic test pattern generation; Automatic testing; Costs; Logic testing; Memory architecture; Test pattern generators; Timing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207861
Filename
207861
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