Title :
Predicting and obtaining high final test yields
Author :
Balzer, Raymond J. ; Larsen, Greg A.
Author_Institution :
Hewlett Packard, Loveland, CO, USA
Abstract :
A model is presented that accurately predicted final test yields following board test for over 75000 boards representing 33 board types. Enhanced in-circuit test commonly provided >95% final test yields. Included are power supplies, high-accuracy analog measurement instrument circuitry, digital controller boards of various sorts using microprocessors or custom devices, medical instrumentation circuits, and in-circuit tester circuitry. Most boards contain a mix of digital and analog circuitry
Keywords :
automatic testing; biomedical measurement; digital simulation; electronic engineering computing; microcomputer applications; printed circuit testing; PCB testing; analog measurement; custom devices; digital controller boards; final test yields; in-circuit test; in-circuit tester; medical instrumentation circuits; microprocessors; power supplies; Circuit faults; Circuit testing; Inspection; Instruments; Power supplies; Predictive models; Printed circuits; Production; Virtual manufacturing; Yield estimation;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207867
