Title :
CIM, electronics manufacturing . . .and ATE
Author :
Hutchinson, Neil
Abstract :
Information technology and CIM (computer-integrated manufacturing) are discussed, specifically looking at the position of ATE (automatic test equipment) systems and vendors in the dynamic information part of a CIM strategy. Some simple ways are suggested of getting started and understanding how accurate shop-floor information can contribute significantly to manufacturing effectiveness
Keywords :
CAD/CAM; automatic test equipment; electronic engineering computing; electronic equipment manufacture; production testing; ATE; CAD/CAM; CIM; computer-integrated manufacturing; electronic engineering computing; electronics manufacturing; shop-floor information; Business; Computer integrated manufacturing; Consumer electronics; Decision making; Game theory; Information technology; Investments; Manufacturing automation; Optimized production technology; Throughput;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207868
