Title :
TASTE: a tool for analog system testability evaluation
Author :
Hemink, G.J. ; Meijer, B.W. ; Kerkhoff, H.G.
Author_Institution :
Dept. of Electr. Eng., Twente Univ., Enschede, Netherlands
Abstract :
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present
Keywords :
automatic testing; integrated circuit testing; linear integrated circuits; monolithic integrated circuits; redundancy; statistical analysis; automatic testing; linear analog systems; nonlinear analog systems; rank-test algorithm; redundant measurements; statistical methods; testability evaluation; Analog circuits; Analog integrated circuits; Bipolar integrated circuits; Circuit faults; Circuit testing; Companies; Electronic equipment testing; Integrated circuit measurements; Integrated circuit testing; System testing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207870
