DCIATP-an iterative analog circuit test generation program for generating DC single pattern tests

An algorithm is proposed for automatic test input generation for nonlinear analog circuits and digital circuits with analog behavior under fault. The algorithm uses high-level reasoning with simple iteration to find inputs which will detect resistive shorts and opens that cause DC errors. A simple version of the algorithm, for the time-domain case, has been implemented. Current work includes incorporating the heuristics into the path-generating algorithm, creating tests for larger circuits, extending the fault model to a parameter change in branches other than resistors (e.g. a β change in a transistor), creating sensitivity metrics for the frequency domain and developing a transient error solution