• DocumentCode
    3112295
  • Title

    A multi-class logistic regression model for interval data

  • Author

    De Souza, Renata M C R ; Cysneiros, Francisco José A ; Queiroz, Diego C F ; de A.Fagundes, R.A.

  • Author_Institution
    Centro de Inf., Univ. Fed. de Pernambuco, Recife
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1253
  • Lastpage
    1258
  • Abstract
    This paper introduces a new classifier based on the multi-class logistic regression model for interval symbolic data. Each example of the learning set is described by a feature vector, for which each feature value is an interval. Two versions of this classifier are considered. First fits a multi-class logistic regression model conjointly on the lower and upper bounds of the interval values assumed by the variables in the learning set. Second fits a multi-class logistic model on the lower and upper bounds separately. The prediction of the class for new examples is accomplished from the computation of the posterior probabilities of the classes. To show the usefulness of this method, examples with synthetic interval symbolic data sets with overlapping classes are considered. The assessment of the proposed classification method is based on the estimation of the average behaviour of the error rate in the framework of the Monte Carlo method.
  • Keywords
    Monte Carlo methods; error statistics; learning (artificial intelligence); pattern classification; probability; regression analysis; symbol manipulation; Monte Carlo method; error rate; feature vector; interval symbolic data classifier; learning set; multiclass logistic regression model; posterior probability; Data analysis; Decision trees; Error analysis; Histograms; Logistics; Machine learning; Predictive models; Probability; Statistical analysis; Upper bound; Classification; Interval data Analysis; Logistic Model; Symbolic Data Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2008. SMC 2008. IEEE International Conference on
  • Conference_Location
    Singapore
  • ISSN
    1062-922X
  • Print_ISBN
    978-1-4244-2383-5
  • Electronic_ISBN
    1062-922X
  • Type

    conf

  • DOI
    10.1109/ICSMC.2008.4811455
  • Filename
    4811455