DocumentCode :
3112310
Title :
System level fault dictionary generation
Author :
Tanaka, Hidetoshi ; Kawai, Masato ; Sugasaki, Lzumi ; Hakuba, Tadanobu
Author_Institution :
NEC Corp., Tokyo, Japan
fYear :
1988
fDate :
12-14 Sep 1988
Firstpage :
884
Lastpage :
887
Abstract :
A fault dictionary generation (FDG) system, which generates a system-level fault dictionary automatically from structural description of computer system hardware, was developed and applied to a large scale computer system. Built-in diagnosis (BID), which is effective in detecting and locating a fault, is described briefly. The mechanism to generate a fault dictionary, based on BID capability, is discussed. The techniques used in tracing a circuit to determine a suspected doubtful circuit domain are explained. The program flow for generating a dictionary from the set of suspected doubtful circuits domain is described. It is shown that FDG is very effective for use in improving accuracy and resolution for the dictionary
Keywords :
automatic testing; computer testing; fault location; logic testing; build in diagnosis; doubtful circuits domain; fault dictionary generation; fault location; large scale computer system; logic testing; Circuit faults; Computer aided manufacturing; Dictionaries; Fault detection; Fault diagnosis; Fault tolerant systems; Hardware; Large-scale systems; Logic circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-8186-0870-6
Type :
conf
DOI :
10.1109/TEST.1988.207876
Filename :
207876
Link To Document :
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