Title :
Automatic location of IC design errors using an E-beam system
Author :
Melgara, M. ; Battu, M. ; Garino, P. ; Dowe, J. ; Vernay, Y.-J. ; Marzouki, Y. ; Boland, F.
Author_Institution :
CSELT, Torino, Italy
Abstract :
The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed search
Keywords :
VLSI; application specific integrated circuits; automatic test equipment; circuit CAD; electron beam applications; fault location; integrated circuit testing; software packages; ADVICE; CAD; E-beam tester; IC design errors; circuit CAD; custom VLSI devices; design errors; fault dictionary/hierarchical probing algorithm; fault location; interactive electron-beam debugging; Algorithm design and analysis; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Debugging; Design automation; Dictionaries; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207878
