DocumentCode
3112507
Title
Simultaneous switching noise evaluation of advanced CMOS logic (ACL)
Author
Stuchlik, Kenneth R.
fYear
1988
fDate
12-14 Sep 1988
Firstpage
948
Lastpage
957
Abstract
Arguments surrounding the pinout strategy are considered for the advanced CMOS logic (ACL). A brief overview of the factors that contribute to switching induced noise is presented, along with a method by which measurements of the induced noise can be made. A review of the fixturing used by different manufacturers is presented and the differences described. Comparisons are made between ACL devices and vendors as well as comparable bipolar and CMOS technologies
Keywords
CMOS integrated circuits; integrated circuit testing; integrated logic circuits; logic testing; CMOS logic; IC testing; bipolar technology; fixturing; integrated logic circuit; simultaneous switching noise; switching induced noise; CMOS logic circuits; CMOS technology; Inductance; Logic devices; Manufacturing; Packaging; Pins; Steady-state; Switches; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207884
Filename
207884
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