Title :
Scan diagnostic strategy for the series 10000 PRISM workstation
Author :
Ricchetti, Mike ; Hoglund, John
Author_Institution :
Apollo Comput. Inc., Chelmsford, MA, USA
Abstract :
The Series 10000 PRISM workstation has been designed to be testable using scan path techniques. An overview of the scan architecture at the chip and system levels shows the basis on which a diagnostic strategy was developed. These strategies were used to achieve diagnostics goals of high fault coverage and component-level fault isolation. A unique fault-isolation method is described which is based on scan path features of the Series 10000 and a logic partitioning method. The software tool set used in scan test development on the Series 10000 is also introduced
Keywords :
automatic testing; computer testing; electronic equipment testing; fault location; logic testing; workstations; component-level fault isolation; diagnostic strategy; fault coverage; fault-isolation; logic partitioning; scan architecture; scan path techniques; series 10000 PRISM workstation; Automatic testing; Clocks; Computer architecture; Graphics; Logic arrays; Pins; Software testing; Software tools; Thyristors; Workstations;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207888
