Title :
1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Abstract :
The following topics were dealt with: error and fault detection; fault tolerance assessment and design; VLSI system testing; yield problems; FPGA design and testing
Keywords :
VLSI; fault diagnosis; fault tolerant computing; integrated circuit design; integrated circuit testing; integrated circuit yield; logic design; logic testing; FPGA design; FPGA testing; VLSI system testing; defect tolerance; error detection; fault detection; fault tolerance assessment; fault tolerance design; yield problems;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris, France
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628302
