The non-linear feedback shift-register as a built-in self-test (BIST) resource

Author

Marinos, Peter N.

Author_Institution

Dept. of Electr. Eng., Duke Univ., Durham, NC, USA

fYear

1988

fDate

12-14 Sep 1988

Firstpage

998

Abstract

Properties of nonlinear-feedback shift registers (NLFSRs), are studied and their suitability as built-in self-test (BIST) components in VLSI circuits is investigated. The feasibility is discussed of mapping fault-free circuit-under-test response to one of the least frequently occurring signatures within the signature space of the n-stage NLFSR. A number of illustrations are offered that justify the serious consideration of NLFSRs as components for use in BIST applications

Keywords

VLSI; automatic testing; feedback; integrated circuit testing; integrated logic circuits; logic testing; shift registers; BIST; IC testing; VLSI circuits; built-in self-test; fault-free circuit-under-test response; logic testing; non-linear feedback shift-register; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Data compression; Feedback circuits; Probability; Size control; Test pattern generators; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-8186-0870-6

Type

conf

DOI

10.1109/TEST.1988.207893

Filename

207893

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3112699