Title :
Partial hardware partitioning: a new pseudo-exhaustive test implementation
Author :
Udell, Jon G., Jr. ; McCluskey, Edward J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
Abstract :
A pseudoexhaustive-test implementation technique is presented which combines the advantages of hardware partitioning and sensitized partitioning, offering lower hardware overhead than hardware partitioning, and lower test-set generation complexity and higher fault coverage than sensitized partitioning
Keywords :
logic design; logic testing; fault coverage; hardware partitioning; logic design; logic testing; pseudo-exhaustive test implementation; sensitized partitioning; test-set generation; Circuit faults; Circuit testing; Combinational circuits; Contracts; Electrical fault detection; Fault detection; Hardware; Logic circuits; Logic testing; Multiplexing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207895
