DocumentCode
3113066
Title
Detecting E and H fields with microstrip transmission lines
Author
Chen, Tze Wee ; Maloney, Timothy J. ; Chou, Bruce
Author_Institution
Centre for Integrated Syst., Stanford Univ., Stanford, CA
fYear
2008
fDate
18-22 Aug. 2008
Firstpage
1
Lastpage
6
Abstract
Microstrip-like transmission lines are used to detect transient electric and magnetic (E and H) fields. Theory and experiment are compared for three different cases. The method can detect E and H fields on a ground plane, or may be integrated into a closed platform for E-H measurements during EMC testing. An application example using a desktop computer is shown. In situ measurements in a closed platform during EMC testing show that system ESD failures are caused by E-H fields, and not by direct voltage or current stress. Therefore, E-H field information measured by using microstrip-like transmission lines on PCBs in a closed platform during EMC tests will give insights to the exact nature of system failures due to ESD.
Keywords
electromagnetic compatibility; electromagnetic fields; microstrip lines; printed circuits; E-H field measurements; EMC testing; PCB; electromagnetic compatibility; microstrip transmission lines; printed circuit board detectors; transient electric fields; transient magnetic fields; Application software; Electromagnetic compatibility; Electrostatic discharge; Magnetic field measurement; Microstrip; Power system transients; System testing; Transmission line measurements; Transmission line theory; Transmission lines; Charged tip discharge; ElectroMagnetic Compatibility (EMC); Printed Circuit Board (PCB) detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location
Detroit, MI
Print_ISBN
978-1-4244-1699-8
Electronic_ISBN
978-1-4244-1698-1
Type
conf
DOI
10.1109/ISEMC.2008.4652009
Filename
4652009
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