Reliability-evaluation of digital circuits using probabilistic computation schemes

Author

Khalid, Usman ; Anwer, Jahanzeb ; Singh, Narinderjit ; Hamid, Nor H. ; Asirvadam, Vijanth S.

Author_Institution

Electr. & Electron. Eng. Dept., Univ. Teknol. PETRONAS (UTP), Bandar Seri Iskandar, Malaysia

fYear

2011

fDate

19-20 Sept. 2011

Firstpage

1

Lastpage

4

Abstract

The reliability is one of the serious issues confronted by microelectronics industry as feature sizes scale down to nano-design level. In this paper, we are providing the analysis to find the accurate and efficient method of finding circuit´s reliability among the available options. The experimental results provide the reliability evaluation of few probabilistic computation schemes. The comparison will be done on unique platform to choose the best scheme amongst all. The simulations have been conducted on small test digital circuits including LGSynth´93 circuits.

Keywords

circuit reliability; digital circuits; logic circuits; probability; LGSynth´93 circuit; circuit reliability evaluation; digital circuit; feature size; microelectronics industry; nanodesign level; probabilistic computation scheme; Digital circuits; Error probability; Integrated circuit modeling; Integrated circuit reliability; Logic gates; Probabilistic logic; Bayesian networks; Boolean difference based error calculator; probabilistic gate model; probabilistic transfer matrix; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

National Postgraduate Conference (NPC), 2011

Conference_Location

Kuala Lumpur

Print_ISBN

978-1-4577-1882-3

Type

conf

DOI

10.1109/NatPC.2011.6136386

Filename

6136386