Title :
Reliability-evaluation of digital circuits using probabilistic computation schemes
Author :
Khalid, Usman ; Anwer, Jahanzeb ; Singh, Narinderjit ; Hamid, Nor H. ; Asirvadam, Vijanth S.
Author_Institution :
Electr. & Electron. Eng. Dept., Univ. Teknol. PETRONAS (UTP), Bandar Seri Iskandar, Malaysia
Abstract :
The reliability is one of the serious issues confronted by microelectronics industry as feature sizes scale down to nano-design level. In this paper, we are providing the analysis to find the accurate and efficient method of finding circuit´s reliability among the available options. The experimental results provide the reliability evaluation of few probabilistic computation schemes. The comparison will be done on unique platform to choose the best scheme amongst all. The simulations have been conducted on small test digital circuits including LGSynth´93 circuits.
Keywords :
circuit reliability; digital circuits; logic circuits; probability; LGSynth´93 circuit; circuit reliability evaluation; digital circuit; feature size; microelectronics industry; nanodesign level; probabilistic computation scheme; Digital circuits; Error probability; Integrated circuit modeling; Integrated circuit reliability; Logic gates; Probabilistic logic; Bayesian networks; Boolean difference based error calculator; probabilistic gate model; probabilistic transfer matrix; reliability;
Conference_Titel :
National Postgraduate Conference (NPC), 2011
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4577-1882-3
DOI :
10.1109/NatPC.2011.6136386
