• DocumentCode
    3113507
  • Title

    On determination of conducted RF immunity test methodology for automotive remote keyless entry receivers

  • Author

    Rostamzadeh, Cyrous ; Pavatich, Frank

  • Author_Institution
    Robert Bosch LLC., Plymouth, MI
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The performance of automotive remote keyless entry systems under the influence of conducted RF injection is investigated. An UHF receiver for automotive applications in the 314.9 MHz frequency band was designed to operate with a 100 meter range, and -110 dBm of sensitivity requirements. The UHF receiver was subjected to conducted RF noise by a bulk current injection test technique over the frequency span of 1 MHz - 400 MHz. The bulk current injection RF amplifier is a source of a broadband noise rich in harmonic content. BCI amplifier harmonics occurring within the SAW and IF filter bandwidth of UHF receivers can severely degrade the performance of the UHF sensitive circuits and can cause performance problems. The use of external filters introduced at the output of a BCI RF amplifier to alleviate the impact of the test equipment is measured and discussed.
  • Keywords
    automotive electronics; immunity testing; radio receivers; radiofrequency amplifiers; radiofrequency filters; IF filter; RF immunity test; RF noise; SAW filter; UHF receiver; automotive remote keyless entry receivers; bulk current injection test; frequency 1 MHz to 400 MHz; frequency 314.9 MHz; Automotive applications; Automotive engineering; Broadband amplifiers; Circuit noise; Power harmonic filters; Radio frequency; Radiofrequency amplifiers; Surface acoustic waves; Testing; UHF circuits; Amplifier Noise Floor; Bulk Current Injection; Common Mode Current (CM); RF Filters; Radio Frequency Keyless Entry System; Tire Pressure Monitor System (TPMS); UHF Receiver (RFR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652029
  • Filename
    4652029