Title :
Thermal performance of 1.55μm InGaAlAs quantum well buried heterostructure lasers
Author :
Sayid, Sayid Ally ; Marko, Igor Pavlovich ; Cannard, Paul J. ; Chen, Xin ; Rivers, Lelsey J. ; Lealman, Ian F. ; Sweeney, Stephen John
Author_Institution :
Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
fDate :
May 31 2010-June 4 2010
Abstract :
We have investigated the threshold current Ith and differential quantum efficiency as the function of temperature in InGaAlAs/InP multiple quantum well (MQWs) buried heterostructure (BH) lasers. We find that the temperature sensitivity of Ith is due to non-radiative recombination which accounts for up to ~80% of Jth at room temperature. Analysis of spontaneous emission emitted from the devices show that the dominant non-radiative recombination process is consistent with Auger recombination. We further show that the above threshold differential internal quantum efficiency, ηi, is ~80% at 20°C remaining stable up to 80°C. In contrast, the internal optical loss, αi, increases from 15 cm-1 at 20°C to 22 cm-1 at 80°C, consistent with inter-valence band absorption (IVBA). This suggests that the decrease in power output at elevated temperatures is associated with both Auger recombination and IVBA.
Keywords :
Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium compounds; indium compounds; quantum well lasers; Auger recombination; InGaAlAs-InP; differential quantum efficiency; inter-valence band absorption; multiple quantum well buried heterostructure lasers; non-radiative recombination process; temperature 20 C; temperature 80 C; threshold current; wavelength 1.55 mum; Indium phosphide; Optical losses; Optical sensors; Quantum well devices; Quantum well lasers; Radiative recombination; Spontaneous emission; Stimulated emission; Temperature sensors; Threshold current;
Conference_Titel :
Indium Phosphide & Related Materials (IPRM), 2010 International Conference on
Conference_Location :
Kagawa
Print_ISBN :
978-1-4244-5919-3
DOI :
10.1109/ICIPRM.2010.5516088