• DocumentCode
    3113662
  • Title

    Configurable EEPROMS for ASICS

  • Author

    Carney, Bob ; Lucero, Elroy ; Mendel, Robi ; Reiter, Herb

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • fYear
    1988
  • fDate
    16-19 May 1988
  • Abstract
    A 5-V only, variable-size EEPROM (electrically erasable programmable read-only memory) is discussed. A test chip providing 256×8-bit memory is described, as well as the methodology used to implement it. Certain special nonvolatile memory circuits are investigated. Application areas, manufacturing issues, and testing techniques are also considered
  • Keywords
    PROM; integrated memory circuits; 2 kbits; configurable memory; electrically erasable programmable read-only memory; manufacturing issues; nonvolatile memory circuits; test chip; testing techniques; variable-size EEPROM; Application specific integrated circuits; DH-HEMTs; EPROM; Latches; Logic arrays; Power generation; Power supplies; Random access memory; Read-write memory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
  • Conference_Location
    Rochester, NY
  • Type

    conf

  • DOI
    10.1109/CICC.1988.20795
  • Filename
    20795
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3113662