DocumentCode :
3113742
Title :
Electromagnetic PCB pattern modeling techniques for RF hardware simulation of mobile phones
Author :
Kim, Yongsup ; Kwon, Soonjae ; Kim, Austin S.
Author_Institution :
Samsung Electron. Co., Suwon
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
4
Abstract :
Various different types of PCB pattern modeling methods for new RF co-simulation technique are presented and applied to wireless phone application. PCB electromagnetic (EM) modeling is essential part of new RF combinational simulation - RF components plus PCB 3D pattern concurrently modeled, however, it takes typically few-hours burdensome modeling time. In this paper, several intermediate forms of PCB modeling methods are evaluated in terms of S-parameters and RF specification such as WCDMA adjacent channel leakage ratio (ACLR) and PCB pattern was pick up from actual mobile phone design in 10-layered FR4 PCB stack-up. Compared to full 3D PCB pattern models, divided pattern model shows competitive accuracy within 0.6~2.0 dBm ACLR average difference and seems to be worthy to replace full PCB pattern models. Experimental data shows that divided pattern modeling technique requires only about 12% of practical full 3D PCB modeling time.
Keywords :
code division multiple access; electromagnetic fields; finite element analysis; mobile handsets; wireless channels; PCB electromagnetic modeling; RF combinational simulation; RF hardware simulation; electromagnetic PCB pattern modeling techniques; mobile phones; wireless phone; Electromagnetic modeling; Hardware; Integrated circuit modeling; Mobile handsets; Multiaccess communication; Power amplifiers; Power system modeling; Radio frequency; Radiofrequency amplifiers; Scattering parameters; ACLR; EM; EVM; FEM; MBM; PAM; PCB; RF; STD; WCDMA;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652043
Filename :
4652043
Link To Document :
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