Title :
Analog-digital integrated test concerns
Author_Institution :
IMS Europe, Slough, UK
fDate :
29 May-1 Jun 1990
Abstract :
Considers the practical test issues concerned with design verification of prototype mixed signal components. Mixed signal testing is treated as an extension to familiar digital test techniques
Keywords :
application specific integrated circuits; integrated circuit testing; design verification; mixed signal components; mixed signal testing; test issues; Analog-digital conversion; Design engineering; Europe; Frequency; Instruments; Prototypes; SPICE; Signal design; System testing; Transient analysis;
Conference_Titel :
Euro ASIC '90
Conference_Location :
Paris
Print_ISBN :
0-8186-2066-8
DOI :
10.1109/EASIC.1990.207957
