DocumentCode
3113812
Title
Detection of yield trends
Author
Pleskacz, Witold A. ; Maly, Wojciech ; Heineken, Hans T.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1997
fDate
20-22 Oct 1997
Firstpage
62
Lastpage
68
Abstract
This paper proposes a yield data filtration procedure. This procedure is intended for the reduction of noise in the yield data. Such a reduction is a key step in the detection of yield trends that have to be known for yield modeling and yield analysis purposes
Keywords
integrated circuit measurement; integrated circuit modelling; integrated circuit yield; production testing; IC measurement; IC yield; noise reduction; yield analysis; yield data filtration; yield modeling; yield trends; Area measurement; Integrated circuit modeling; Integrated circuit noise; Loss measurement; Noise reduction; Semiconductor device modeling; Testing; Time measurement; Virtual manufacturing; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location
Paris
ISSN
1550-5774
Print_ISBN
0-8186-8168-3
Type
conf
DOI
10.1109/DFTVS.1997.628310
Filename
628310
Link To Document