DocumentCode
3113814
Title
A test strategy for mixed analog/digital ASICS
Author
Valdenaire, Patrick ; Gauthron, Christophe
Author_Institution
VLSI Technol. Inc., San Jose, CA, USA
fYear
1990
fDate
29 May-1 Jun 1990
Firstpage
300
Lastpage
304
Abstract
Typical examples of analog functions and their testing are described. It is shown, that these tests can be performed on digital testers. A test strategy for mixed ASICs is proposed, as an extension of techniques applicable to digital ASICs
Keywords
application specific integrated circuits; integrated circuit testing; analog functions; digital testers; mixed analog/digital ASICS; test strategy; Application specific integrated circuits; Automatic testing; Circuit testing; Design automation; Logic testing; Performance analysis; Performance evaluation; Software libraries; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Euro ASIC '90
Conference_Location
Paris
Print_ISBN
0-8186-2066-8
Type
conf
DOI
10.1109/EASIC.1990.207958
Filename
207958
Link To Document