DocumentCode
3113856
Title
Introduction of the Varian VIISta 3000 single wafer high-energy ion implanter
Author
Tokoro, Nobuhiro ; Holbrook, David ; Hacker, David
Author_Institution
Varian Semicond. Equip. Associates Inc., Newburyport, MA, USA
fYear
2000
fDate
2000
Firstpage
368
Lastpage
371
Abstract
Varian Semiconductor Equipment Associates, Inc. has developed the VIISta 3000 single wafer high-energy ion implanter to meet requirements of advanced 200 and 300 mm wafer processes. The basic design of this system consists of well established TandetronTM DC beamline architecture, the electrostatic beam scanning and dose control system developed for the VIISta 810 medium current ion implanter and the common endstation and control system developed for VIISta series ion implanters. Enabling transportation of the positive beam directly from the ion source to the wafer has significantly enhanced the low energy beam performance. This paper describes basic system design and performance of the VIISta 3000 high-energy ion implanter including the beam current performance, implant uniformity, dose shift due to photoresist outgassing, etc
Keywords
beam handling equipment; ion implantation; semiconductor device manufacture; 200 mm; 200 mm wafer processes; 300 mm; 300 mm wafer processes; TandetronTM DC beamline architecture; Varian Semiconductor Equipment Associates, Inc.; Varian VIISta 3000 single wafer high-energy ion implanter; basic system design; beam current performance; dose control system; electrostatic beam scanning system; endstation/control system; implant uniformity; photoresist outgassing dose shift; positive beam transportation; system performance; Accelerator magnets; Control systems; Electrostatics; Implants; Ion sources; Magnetic analysis; Magnetic separation; Particle beams; Resists; Weight control;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology, 2000. Conference on
Conference_Location
Alpbach
Print_ISBN
0-7803-6462-7
Type
conf
DOI
10.1109/.2000.924164
Filename
924164
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