• DocumentCode
    3113881
  • Title

    Response of a magnetic loop probe to the current and voltage on a microstrip line

  • Author

    Spang, Matthias ; Albach, Manfred ; Schubert, Goeran

  • Author_Institution
    Dept. of Electromagn. Fields, Friedrich-Alexander Univ. Erlangen-Nuremberg, Nuremberg
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a method to determine the coupling of the current and the voltage on a microstrip trace into a magnetic field probe located above the trace. The application of different load impedances to the trace yields different ratios between current and voltage and therefore allows to identify the responses of the probe to both values separately. In the ideal case the output voltage of the loop probe should only be caused by the trace current via magnetic coupling, but in reality parasitic electric field coupling leads to an additional probe signal proportional to the voltage on the device under test (DUT).
  • Keywords
    electric fields; magnetic fields; microstrip lines; device under test; magnetic coupling; magnetic field probe; magnetic loop probe; microstrip line; parasitic electric field coupling; Electromagnetic coupling; Electromagnetic fields; Impedance; Magnetic field measurement; Magnetic fields; Magnetic separation; Microstrip; Probes; Transfer functions; Voltage; Near-field scan; electric field coupling; magnetic loop probes; simulation; transfer function;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652051
  • Filename
    4652051